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Colnatec Press releases

1 - 4 of 4 Press Releases

Jan 09, 2014
Rackmount controller tackles competition with temperature measurement feature at fraction of prevailing cost

May 20, 2013
Colnatec Tempe™ sensor system to be proven as world’s first in situ film thickness monitoring system for Atomic Layer Deposition

Apr 16, 2013
Colnatec Tempe™ sensor to be tested on manufacturing scale equipment with a focus on improving yield, extending run times, and increasing conversion efficiency for CIGS thin film solar cell manufacturing

Nov 07, 2012
Sensor promises to dramatically change the economics of OLED thin film manufacturing


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