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k-Space Associates, Inc. Press releases

1 - 10 of 14 Press Releases

Jul 14, 2022
New sales agreement builds on the company's success delivering custom metrology solutions for solar panel, glass, and semiconductor device manufacturers.

Jul 07, 2022
Thin-film metrology company started as university spinoff now has thousands of customers worldwide.

Mar 21, 2017
k-Space Associates, Inc., manufacturer of in situ, ex situ, and in-line metrology tools for the semiconductor industry, announced that Leti, an institute of CEA and leading innovator in nanotechnology research and technology, has installed a kSA MOS...

Nov 03, 2015
k-Space Associates, Inc., a leader in thin-film characterization, is pleased to announce the addition of film thickness, 660nm reflectance, and spectral reflectance measurements to its kSA MOS UltraScan system.

Sep 15, 2015
k-Space Associates, Inc. ( is pleased to announce the release of the kSA Scanning Pyro, an in-situ tool designed to measure temperature variations across Veeco K465i wafer carriers.

Aug 13, 2015
Researchers at k-Space Associates, Inc. were awarded a U.S. patent (number US 9,030,652 B2) for reflectivity triggering technology for free rotating wafer carriers.

Aug 04, 2015
k-Space Associates, Inc. (, leaders in thin film characterization products, announced today the worldwide release of its newest product, kSA SpectraTemp, a unique, self-calibratingabsolute source temperature measurement tool.

Jul 27, 2015
450, 550, and 960 nm Reflectance During GaN template Deposition on Sapphire

Jun 10, 2015
Easier to use site helps scientists and researchers find the right thin-film metrology tools

Apr 30, 2015
k-Space Associates, Inc. ( announces a new auto exposure capability available for the kSA 400 analytical RHEED system.

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