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Chroma ATE Inc. Press releases

1 - 10 of 20 Press Releases

Apr 05, 2018
Chroma ATE Inc. is introducing its new digital service to provide you information for test and automation turkey solutions via the app.

May 16, 2017
Chroma ATE Inc. CEO Leo Huang received the Distinguished Enterprise Innovation Award, the highest honor available from the 5th Industrial Innovation Award during the awards ceremony held on April 21.

May 16, 2017
Chroma ATE, a world leading supplier of electronic test, measurement, and manufacturing equipment, is pleased to announce they will be exhibiting at the 54th SID International Symposium, Seminar and Exhibition this year in Los Angeles.

Apr 28, 2016
Harvard Business Review magazine today (4/21) announced Taiwan Top 50 Best-Performing CEOs. The CEO of Chroma ATE Inc. Leo Huang has awarded as the Taiwan Top 50 Best-Performing CEO, ranked No.38 with the performance of ROE 1,011% (No.

Nov 03, 2014
Chroma ATE Inc., a world leading manufacturer of precision Test and Measurement Instrumentation, Automated Test Systems, Manufacturing Execution Systems and Turnkey Test and Automation Solutions, is celebrating its 30th anniversary.

Jul 16, 2013
Chroma ATE, a world leading supplier of electronic test, measurement and manufacturing equipment, has announced today the newest SMU model in its line of PXI products. The 52405 is a high precision source measure unit with dual SMU channels.

Mar 26, 2013
Chroma launches a variety of LED lamps production line test solutions which will be presented to attendees of the 2013 Taiwan International Lighting...

Mar 06, 2013
Chroma ATE Inc. was selected by the Industrial Development Bureau, Ministry of Economy Affairs for its unique and critical technology in particular areas that have high competitiveness in the international market.

Jan 24, 2012
Chroma ATE has introduced its new Chroma 58173-V Laser Diode Test System, providing a total solution for VCSEL production lines from wafer to final package. The system is being unveiled this week at SPIE Photonics West in San Francisco, California.

Jan 23, 2012
Chroma ATE has introduced its new Chroma Optoelectronic Source Measurement System designed for burn-in, reliability and life testing of optoelectronic components. The system is being unveiled this week at SPIE Photonics West in San Francisco, CA.


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