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Chroma ATE Inc. Press releases

11 - 20 of 25 Press Releases

Jul 16, 2013
Chroma ATE, a world leading supplier of electronic test, measurement and manufacturing equipment, has announced today the newest SMU model in its line of PXI products. The 52405 is a high precision source measure unit with dual SMU channels.

Mar 26, 2013
Chroma launches a variety of LED lamps production line test solutions which will be presented to attendees of the 2013 Taiwan International Lighting...

Mar 06, 2013
Chroma ATE Inc. was selected by the Industrial Development Bureau, Ministry of Economy Affairs for its unique and critical technology in particular areas that have high competitiveness in the international market.

Jan 24, 2012
Chroma ATE has introduced its new Chroma 58173-V Laser Diode Test System, providing a total solution for VCSEL production lines from wafer to final package. The system is being unveiled this week at SPIE Photonics West in San Francisco, California.

Jan 23, 2012
Chroma ATE has introduced its new Chroma Optoelectronic Source Measurement System designed for burn-in, reliability and life testing of optoelectronic components. The system is being unveiled this week at SPIE Photonics West in San Francisco, CA.

Dec 12, 2011
Multiplying engineers resources with minimal investment, Chroma ATE announced its new 3110 Hybrid Handler for the Semiconductor Industry offering a compact footprint, fully automated device handing, multi bin sorting and remote capabilities.

Nov 17, 2011
Chroma ATE has announced its new VI-45 Analog Resource Board - the industry’s first analog resource with TMU per pin architecture. The VI-45 is the first in a series of analog resources developed for the Chroma 3650 Test System.

Oct 26, 2011
Chroma ATE announced its new 17020 Regenerative Battery Pack Test System for secondary battery module and pack test and features a regenerative energy discharge design.

Oct 25, 2011
Chroma ATE has announced its new 17200 Programmable Charge/Discharge Tester for Lithium-Ion Batteries with modularized multi-channel architecture supporting CV (Constant Voltage), CC (Constant Current) and CP (Constant Power) test modes.

Mar 24, 2011
Chroma ATE will be showcasing select devices from their product lineup of video pattern generators and color analyzers at the 49th SID International Symposium, Seminar and Exhibition this year in Los Angeles.


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